Atomic force microscopes use a scanning probe that maintains a fixed distance from the surface of the specimen. It is useful for specimens that

Atomic force microscopes use a scanning probe that maintains a fixed distance from the surface of the specimen. It is useful for specimens that 









A. do not conduct electricity well.
B. have extremely uneven surfaces.
C. both do not conduct electricity well and have extremely uneven surfaces are correct.
D. neither do not conduct electricity well nor have extremely uneven surfaces is correct.









Answer: A


Microbiology

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